EDXRF sulfur analyzer (SE)
Analyzer for quantification of sulfur in liquids by Energy dispersive X-Ray Fluorescence
Analyzer for quantification of sulfur in liquids by Energy dispersive X-Ray Fluorescence
Spectroscan SE provides quick, accurate, and reliable quantification of Sulfur weight content in nearly all types of liquids.
Spectroscan SE uses Energy-dispersive X-Ray fluorescence method that is very easy to run, requires no sample treatment and delivers accurate results with high repeatability quickly.
Spectroscan SE analyzer fully complies with international standards for sulfur analysis by EDXRF technique.
Built-in tablet PC with 7-inch color touch-screen deliver flexibility in creating user calibrations.
Due to side position of X-ray tube and detector to sample compartment costly optic components are protected from sample spill. The accuracy is improved and LOD is lower as no detector protection film is needed for this design.
Advantage:
Due to the original design no He blowdown is required, providing LOD as low as 1.5 ppm
- Simple in operation, now installation required;
- Analyzer parameters are suitable for mobile laboratories;
- The sample data and analysis results are shown in display and printed out by inbuilt printer;
- Special ventilated cups are developed for volatile samples.
Due to lateral position of the sample:
- Error due to water and air bulbs are excluded;
- Contamination of the inner parts of the analyzer is excluded;
- Additional errors due to contamination of the additional protection film is excluded;
- Sample loading unit is easily cleaned.
Minimum operator actions:
- Put in the number or name of the sample from inbuilt key-board;
- Fill in two sample cups with the sample;
- Put in the samples into the analyzer and start measurements.
All the rest operations are run automatically.
Application
Spectroscan SE provides quick, accurate, and reliable quantification of Sulfur weight content in nearly all types of liquids.
Spectroscan SE analyzer fully complies with international standards for sulfur analysis by EDXRF technique.
| Measurement principle |
Energy dispersive X-ray fluorescence (EDXRF) |
|---|---|
| Detector |
Gas-sealed proportional counter or silicon drift detector (SDD) as option |
| Limit of detection (LOD) |
1.5 ppm |
| Repeatability |
less than 200 ppm for 2.0 wt% sample, less than 4.1 ppm for 100 ppm sample |
| Measurement time |
10 – 999 seconds user selectable., Typical time for two repeats of one sample – 2 minutes |
| X-ray tube and sample geometry |
Side position of X-ray tube and detector to sample compartment Prevents tube contamination in case of sample spill |
| Sample cup |
Ventilated, Ø 32 mm, 7 mL volume |
| Calibration |
Pre-uploaded calibrations for ASTM, ISO and other standards, up to 1 000 user calibration curves |
| User interface |
7-inch Color touch-screen Graphs and calibration plots display User, supervisor and service modes |
| Results print-out |
Built-in thermal printer |
| Outputs |
RJ-45, RS-232, USB LIMS-connection |
| Power supply |
230 ± 10% V 50 ± 1 Hz Less than 100 VA |
| Dimensions |
400 x 320 x 185 |
| Weight |
8.5 |
| Environmental conditions |
– 40 — + 45 °C, + 10 — + 35 °C, ≤ 80 % humid. at 25°C |
| brand | |
| Standards |
